Spectroflurimeter FLUOROLOG 3 – HORIBA JOBIN YVON

Spectral range :

Excitation from 250 nm to 700 nm

Emission from 350 nm to 900 nm

Measurement of emission spectra, excitation spectra or “2D” (scanning of both excitation and emission wavelength).

The polarization resolution is available for excitation and emission.

Samples :

Liquid solutions:  1 cm x 1 cm spectroscopy cuvette holder.

Films: microscopy slide holder.

Powders and diffusing materials: integrating sphere adapted for quartz tubes.

Spectrophotometer UV-Vis-PIR Perkin-Elmer Lambda 950

Spectral range:

from 190 nm to 3300 nm for transmission and reflection operations.

from 190 nm to 2500 nm with integrating sphere.

Samples:

Liquid solutions:  1 cm x 1 cm spectroscopy cuvette holder.

Films: microscopy slide holder.

Powders and diffusing materials: integrating sphere.

Possibility to measure specular reflection for thin films at various angles.

Optical profilometer Zygo Newview

The optical profilometer measures the sample topography
at the microscopic scale. It is particularly well adapted for
contact free measurement of the thickness of thin films.

In plane resolution: 3 µm

Vertical resolution: 2 nm

Maximum thickness: 100 µm