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INSTITUT DE PHYSIQUE ET DE CHIMIE DES MATERIAUX DE STRASBOURG
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Ultrafast Optics and Nanophotonics (DON) Instruments of don Optical Characterization

Optical Characterization

The optical characterization plateform of the IPCMS offers an access to: an absorption spectrometer,
a spectrofluorimeter and an optical profilometer. It is open to all IPCMS personnel and to exterior
researchers working for accademic or industrial laboratories.

RESERVATION
  • Spectrofluorimeter
  • Spectrophotometer
  • Optical profilometer

Spectroflurimeter FLUOROLOG 3 – HORIBA JOBIN YVON

Spectral range :

Excitation from 250 nm to 700 nmFluorolog

Emission from 350 nm to 900 nm

 

Measurement of emission spectra, excitation spectra or “2D” (scanning of both excitation and emission wavelength).

The polarization resolution is available for excitation and emission.

 

Samples :

Liquid solutions:  1 cm x 1 cm spectroscopy cuvette holder.

Films: microscopy slide holder.

Powders and diffusing materials: integrating sphere adapted for quartz tubes.

Spectrophotometer UV-Vis-PIR Perkin-Elmer Lambda 950

Spectral range:

from 190 nm to 3300 nm for transmission and reflection operations.Perkin Elmer

from 190 nm to 2500 nm with integrating sphere.

 

Samples:

Liquid solutions:  1 cm x 1 cm spectroscopy cuvette holder.

Films: microscopy slide holder.

Powders and diffusing materials: integrating sphere.

 

Possibility to measure specular reflection for thin films at various angles.

Optical profilometer Zygo Newview

The optical profilometer measures the sample topography
at the microscopic scale. It is particularly well adapted for
contact free measurement of the thickness of thin films.Zygo

In plane resolution: 3 µm

Vertical resolution: 2 nm

Maximum thickness: 100 µm

Contact:

Damien CIANFARANI

Photo of M. Damien CIANFARANI
Technicien (TCN) – CNRSIPCMS – Département d’Optique ultrarapide et de Nanophotonique (DON) 23 rue du Loess BP 43 Bureau : 2206 Strasbourg 67034 work Téléphone: (33) 3 88 10 72 69workFax: (33) 3 88 10 72 49workfax Courriel: INTERNET Website: page personnelle

Loic MAGER

Photo of M. Loic MAGER
Chargé de recherche (CR1) – CNRSIPCMS – Département d’Optique ultrarapide et de Nanophotonique (DON) 23 rue du Loess BP 43 Bureau : 2051 Strasbourg 67034 work Téléphone: +33 (0)3 88 10 70 90workFax: +33 (0)3 88 10 72 49workfax Courriel: INTERNET Website: page personnelle

Institut de Physique et de Chimie des Matériaux de Strasbourg

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