In-situ electron microscopy allows the manipulation of the object while it is observed in the TEM. Electron irradiation, high specimen temperature, contacting by an electrode, and a gaseous environment can be applied to carry out experiments in the specimen chamber of the TEM. This enables us to obtain not only structural information but a detailed characterization of the object. Phase transformations, radiation effects, electrical conductivities, or chemical reactivities can thus be studied on the sub-nanometer or even atomic scale.
